2023

Mordue, C. W., Weaver, J. M.R. and Dobson, P. (2023) Thermal induced deflection in atomic force microscopy cantilevers: analysis and solution. Measurement Science and Technology, 34(12), 125013. (doi: 10.1088/1361-6501/acf061)

Razeghi, M. et al. (2023) Single-material MoS2 thermoelectric junction enabled by substrate engineering. npj 2D Materials and Applications, 7, 36. (doi: 10.1038/s41699-023-00406-z)

2022

Shields, T., Dada, A. C. , Hirsch, L., Yoon, S., Weaver, J. M. R., Faccio, D. , Caspani, L., Peccianti, M. and Clerici, M. (2022) Electro-optical sampling of single-cycle Thz fields with single-photon detectors. Sensors, 22(23), 9432. (doi: 10.3390/s22239432)

2019

Umatova, Z., Zhang, Y., Rajkumar, R., Dobson, P. S. and Weaver, J.M.R. (2019) Quantification of atomic force microscopy tip and sample thermal contact. Review of Scientific Instruments, 90(9), 095003. (doi: 10.1063/1.5097862)

2017

Ge, Y., Zhang, Y., Weaver, J. M.R. and Dobson, P. S. (2017) Dimension- and shape-dependent thermal transport in nano-patterned thin films investigated by scanning thermal microscopy. Nanotechnology, 28(48), 485706. (doi: 10.1088/1361-6528/aa93cf)

2016

Ge, Y., Zhang, Y., Booth, J. A., Weaver, J. M.R. and Dobson, P. S. (2016) Quantification of probe-sample interactions of a scanning thermal microscope using a nanofabricated calibration sample having programmable size. Nanotechnology, 27(32), 325503. (doi: 10.1088/0957-4484/27/32/325503) (PMID:27363896)

2015

Ge, Y., Zhang, Y., Weaver, J. M.R., Zhou, H. and Dobson, P. S. (2015) Topography-free sample for thermal spatial response measurement of scanning thermal microscopy. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 33, 06FA03. (doi: 10.1116/1.4933172)

2014

Samarelli, A. et al. (2014) Prospects for SiGe thermoelectric generators. Solid-State Electronics, 98, 70 - 74. (doi: 10.1016/j.sse.2014.04.003)

Thoms, S. , Macintyre, D. S., Docherty, K. E. and Weaver, J. M.R. (2014) Alignment verification for electron beam lithography. Microelectronic Engineering, 123, pp. 9-12. (doi: 10.1016/j.mee.2014.02.005)

Samarelli, A. et al. (2014) Multilayered Ge/SiGe material in microfabricated thermoelectric modules. Journal of Electronic Materials, 43(10), pp. 3838-3843. (doi: 10.1007/s11664-014-3233-z)

2013

Rossi, S., Alomari, M., Zhang, Y., Bychikhin, S., Pogany, D., Weaver, J.M.R. and Kohn, E. (2013) Thermal analysis of submicron nanocrystalline diamond films. Diamond and Related Materials, 40, pp. 69-74. (doi: 10.1016/j.diamond.2013.10.004)

Cecchi, S. et al. (2013) Ge/SiGe superlattices for thermoelectric devices grown by low-energy plasma-enhanced chemical vapor deposition. Journal of Electronic Materials, 42(7), pp. 2030-2034. (doi: 10.1007/s11664-013-2511-5)

Ferre Llin, L. et al. (2013) Thermal conductivity measurement methods for SiGe thermoelectric materials. Journal of Electronic Materials, 42(7), pp. 2376-2380. (doi: 10.1007/s11664-013-2505-3)

Samarelli, A. et al. (2013) Power factor characterization of Ge/SiGe thermoelectric superlattices at 300 K. Journal of Electronic Materials, 42(7), pp. 1449-1453. (doi: 10.1007/s11664-012-2287-z)

Samarelli, A. et al. (2013) The thermoelectric properties of Ge/SiGe modulation doped superlattices. Journal of Applied Physics, 113(23), Art. 233704. (doi: 10.1063/1.4811228)

Paul, D.J. et al. (2013) Prospects for SiGe thermoelectric generators. In: 14th International Conference on Ultimate Integration on Silicon (ULIS) 2013, Warwick, U.K., 19-21 Mar 2013, pp. 5-8. (doi: 10.1109/ULIS.2013.6523478)

2012

Burt, D.P., Dobson, P.S. , Docherty, K.E., Jones, C.W., Leach, R.K., Thoms, S. , Weaver, J.M.R. and Zhang, Y. (2012) Aperiodic interferometer for six degrees of freedom position measurement. Optics Letters, 37(7), pp. 1247-1249. (doi: 10.1364/OL.37.001247)

Denholme, S.J., Dobson, P.S. , Weaver, J.M.R., MacLaren, I. and Gregory, D.H. (2012) Growth and characterisation of titanium sulphide nanostructures by surface-assisted vapour transport methods; from trisulphide ribbons to disulphide nanosheets. International Journal of Nanotechnology, 9(1-2), pp. 23-38. (doi: 10.1504/IJNT.2012.044828)

Liu, Z., Chen, X., Zhang, Y., Weaver, J. and Roberts, C.J. (2012) An optical leveling technique for parallel near-field photolithography system. Applied Physics Letters, 101(17), p. 173112. (doi: 10.1063/1.4764912)

Paul, D. et al. (2012) Si/SiGe nanoscale engineered thermoelectric materials for energy harvesting. In: 12th IEEE Conference on Nanotechnology, Birmingham, UK, 20-23 Aug 2012, (doi: 10.1109/NANO.2012.6322044)

Paul, D. et al. (2012) Si/SiGe thermoelectric generators. ECS Transactions, 50(9), pp. 959-963. (doi: 10.1149/05009.0959ecst)

Zhang, Y., Dobson, P.S. , Weaver, J.M.R., Rossi, S., Alomari, M., Kohn, E., Bychikhin, S. and Pogany, D. (2012) Measuring thermal conductivity of nanocrystalline diamond film with a scanning thermal microscope. In: 12th IEEE Conference on Nanotechnology, Birmingham, UK, 20-23 Aug 2012,

2011

ul-Haq, E., Liu, Z., Zhang, Y., Alang Ahmad, S.A., Wong, L.S., Hobbs, J., Leggett, G., Micklefield, J., Roberts, C. and Weaver, J. (2011) The Snomipede: a parallel platform for scanning near-field photolithography. Journal of Materials Research, 26(24), pp. 2997-3008. (doi: 10.1557/jmr.2011.370)

Basith, M., McVitie, S. , McGrouther, D. , Chapman, J.N. and Weaver, J. (2011) Direct comparison of domain wall behavior in permalloy nanowires patterned by electron beam lithography and focused ion beam milling. Journal of Applied Physics, 110(8), 083904. (doi: 10.1063/1.3642966)

Zhang, Y., Dobson, P. and Weaver, J. (2011) Batch fabricated dual cantilever resistive probe for scanning thermal microscopy. Microelectronic Engineering, 88(8), pp. 2435-2438. (doi: 10.1016/j.mee.2011.02.040)

2010

Denholme, S.J., Gallagher, J.B., Dobson, P.S. , Weaver, J.M.R. and Gregory, D.H. (2010) New surface-directed vapour transport methods for the controlled growth of nickel sulfide nanomaterials. Israel Journal of Chemistry, 50(4), pp. 515-523. (doi: 10.1002/ijch.201000061)

The University Court of the University of Glasgow; Weaver, Jonathan M.R.; Dobson, Phillip S.; Burt, David P.; Thoms, Stephen; Docherty, Kevin E.; Zhang, Yuan (2010) Uses of Electromagnetic Interference Patterns. .

Edgeworth, J.P., Burt, D.P., Dobson, P.S. , Weaver, J.M.R. and Macpherson, J.V. (2010) Growth and morphology control of carbon nanotubes at the apexes of pyramidal silicon tips. Nanotechnology, 21(10), (doi: 10.1088/0957-4484/21/10/105605)

ul Haq, E. et al. (2010) Parallel scanning near-field photolithography: the snomipede. Nano Letters, 10(11), pp. 4375-4380. (doi: 10.1021/nl1018782)

Zhang, Y., Docherty, K.E. and Weaver, J. (2010) Batch fabrication of cantilever array aperture probes for scanning near-field optical microscopy. Microelectronic Engineering, 87(5-8), pp. 1229-1232. (doi: 10.1016/j.mee.2009.11.140)

2009

Burt, D.P., Whyte, W.M., Weaver, J.M.R., Glidle, A., Edgeworth, J.P., Macpherson, J.V. and Dobson, P.S. (2009) Effects of metal underlayer grain size on carbon nanotube growth. Journal of Physical Chemistry C, 113(34), pp. 15133-15139. (doi: 10.1021/jp902117g)

Docherty, K., Lister, K.A., Romijn, J. and Weaver, J.M.R. (2009) High robustness of correlation-based alignment with Penrose patterns to marker damage in electron beam lithography. Microelectronic Engineering, 86(4-6), pp. 532-534. (doi: 10.1016/j.mee.2008.11.037)

2008

O'Shea, K.J., McVitie, S. , Chapman, J.N. and Weaver, J.M.R. (2008) Direct observation of changes to domain wall structures in magnetic nanowires of varying width. Applied Physics Letters, 93(20), p. 202505. (doi: 10.1063/1.3023048)

Kong, X., McVitie, S., Chapman, J.N., Weaver, J.M.R., O'Donnell, D.O. and Johnston, A.B. (2008) Magnetization processes in single-layer and laminated CoFe films patterned into multiscale elements with write-head-like geometries. Journal of Applied Physics, 104, 013925. (doi: 10.1063/1.2952068)

Kong, X., Krasa, D., Zhou, H. P., Williams, W., McVitie, S. , Weaver, J. M. R. and Wilkinson, C. D. W. (2008) Very high resolution etching of magnetic nanostructures in organic gases. Microelectronic Engineering, 85(5-6), pp. 988-991. (doi: 10.1016/j.mee.2007.12.006)

Burt, D. P., Dobson, P. S. , Donaldson, L. and Weaver, J. M. R. (2008) A simple method for high yield fabrication of sharp silicon tips. Microelectronic Engineering, 85(3), pp. 625-630. (doi: 10.1016/j.mee.2007.11.010)

Docherty, K.E., Thoms, S. , Dobson, P. and Weaver, J.M.R. (2008) Improvements to the alignment process in a commercial vector scan electron beam lithography tool. Microelectronic Engineering, 85(5-6), pp. 761-763. (doi: 10.1016/j.mee.2008.01.081)

2007

Aubry, R., Jacquet, J., Weaver, J., Durand, O., Dobson, P., Mills, G., di Forte-Poisson, M., Cassette, S. and Delage, S. (2007) SThM temperature mapping and nonlinear thermal resistance evolution with bias on AlGaN/GaN HEMT devices. IEEE Transactions on Electron Devices, 54, pp. 385-390. (doi: 10.1109/TED.2006.890380)

Burt, D.P., Dobson, P.S. , Weaver, J.M.R., Wilson, N.R., Unwin, P.R. and Macpherson, J.V. (2007) Developments in nanowire scanning electrochemical - atomic force microscopy (SECM-AFM) probes. In: IEEE Sensors Conference, Atlanta, GA, 28-31 Oct 2007, pp. 712-715. (doi: 10.1109/ICSENS.2007.4388499)

2006

Dobson, P., Weaver, J., Burt, D., Holder, M., Wilson, N., Unwin, P. and Macpherson, J. (2006) Electron beam lithographically-defined scanning electrochemical-atomic force microscopy probes: fabrication method and application to high resolution imaging on heterogeneously active surfaces. Physical Chemistry Chemical Physics, 8, pp. 3909-3914. (doi: 10.1039/b605828k)

Macintyre, D.S., Young, I., Glidle, A., Cao, X., Weaver, J.M.R. and Thoms, S. (2006) High resolution e-beam lithography using a thin titanium layer to promote resist adhesion. Microelectronic Engineering, 83(4-9), pp. 1128-1131. (doi: 10.1016/j.mee.2006.01.103)

2005

Burt, D., Wilson, N., Weaver, J., Dobson, P. and Macpherson, J. (2005) Nanowire probes for high resolution combined scanning electrochemical Microscopy - Atomic force Microscopy. Nano Letters, 5, pp. 639-643. (doi: 10.1021/nl050018d)

Dobson, P., Mills, G. and Weaver, J. (2005) Microfabricated temperature standard based on Johnson noise measurement for the calibration of micro- and nano-thermometers. Review of Scientific Instruments, 76, (doi: 10.1063/1.1899463)

Dobson, P., Weaver, J., Holder, M., Unwin, P. and Macpherson, J. (2005) Characterization of batch-microfabricated scanning electrochemical-atomic force microscopy probes. Analytical Chemistry, 77, pp. 424-434. (doi: 10.1021/ac048930e)

Steinmann, P. and Weaver, J. (2005) Nanometer-scale gaps between metallic electrodes fabricated using a statistical alignment technique. Applied Physics Letters, 86, (doi: 10.1063/1.1862342)

2004

Lister, K.A., Thoms, S. , Macintyre, D.S., Wilkinson, C.D.W., Weaver, J.M.R. and Casey, B.G. (2004) Direct imprint of sub-10 nm features into metal using diamond and SiC stamps. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 22(6), pp. 3257-3259. (doi: 10.1116/1.1825010)

Lister, K., Casey, B., Dobson, P., Thoms, S., Macintyre, D., Wilkinson, C. and Weaver, J. (2004) Pattern transfer of a 23 nm-period grating and sub-15 nm dots into CVD diamond. Microelectronic Engineering, 73-4, pp. 319-322. (doi: 10.1016/j.mee.2004.02.060)

Steinmann, P. and Weaver, J.M.R. (2004) Fabrication of sub-5 nm gaps between metallic electrodes using conventional lithographic techniques. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 22(6), pp. 3178-3181. (doi: 10.1116/1.1808712)

2003

Steinmann, P., Lister, K.A. and Weaver, J.M.R. (2003) Fabrication of metallic tunnel junctions for the scanning single electron transistor atomic force microscope. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 21(5), pp. 2138-2141. (doi: 10.1116/1.1612931)

2002

Johannessen, E., Weaver, J., Bourova, L., Svoboda, P., Cobbold, P. and Cooper, J. (2002) Micromachined nanocalorimetric sensor for ultra-low-volume cell-based assays. Analytical Chemistry, 74, pp. 2190-2197. (doi: 10.1021/ac011028b)

Johannessen, E., Weaver, J., Cobbold, P. and Cooper, J. (2002) Heat conduction nanocalorimeter for pl-scale single cell measurements. Applied Physics Letters, 80, pp. 2029-2031. (doi: 10.1063/1.1457532)

2001

Chong, B.K., Zhou, H., Mills, G., Donaldson, L. and Weaver, J.M.R. (2001) Scanning Hall probe microscopy on an atomic force microscope tip. Journal of Vacuum Science and Technology A: Vacuum, Surfaces, and Films, 19(4), pp. 1769-1772.

2000

Zhou, H., Chong, B.K., Stopford, P., Mills, G., Midha, A., Donaldson, L. and Weaver, J. (2000) Lithographically defined nano and micro sensors using "float coating" of resist and electron beam lithography. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 18(6), pp. 3594-3599. (doi: 10.1116/1.1321271)

1999

Zhou, H., Midha, A., Mills, G., Donaldson, L. and Weaver, J.M.R. (1999) Scanning near-field optical spectroscopy and imaging using nanofabricated probes. Applied Physics Letters, 75(13), pp. 1824-1826. (doi: 10.1063/1.124840)

Zhou, H., Midha, A., Bruchhaus, L., Mills, G., Donaldson, L. and Weaver, J.M.R. (1999) Novel scanning near-field optical microscopy/atomic force microscope probes by combined micromachining and electron-beam nanolithography. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 17(5), p. 1954. (doi: 10.1116/1.590855)

Zhou, H., Mills, G., Chong, B.K., Midha, A., Donaldson, L. and Weaver, J.M.R. (1999) Recent progress in the functionalization of atomic force microscope probes using electron-beam nanolithography. Journal of Vacuum Science and Technology A: Vacuum, Surfaces, and Films, 17(4), pp. 2233-2239. (doi: 10.1116/1.581753)

1998

Mills, G., Zhou, H., Midha, A., Donaldson, L. and Weaver, J.M.R. (1998) Scanning thermal microscopy using batch fabricated thermocouple probes. Applied Physics Letters, 72(22), pp. 2900-2902. (doi: 10.1063/1.121453)

Zhou, H., Midha, A., Mills, G., Thoms, S. , Murad, S.K. and Weaver, J.M.R. (1998) Generic scanned-probe microscope sensors by combined micromachining and electron-beam lithography. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 16(1), pp. 54-58. (doi: 10.1116/1.589835)

Articles

Mordue, C. W., Weaver, J. M.R. and Dobson, P. (2023) Thermal induced deflection in atomic force microscopy cantilevers: analysis and solution. Measurement Science and Technology, 34(12), 125013. (doi: 10.1088/1361-6501/acf061)

Razeghi, M. et al. (2023) Single-material MoS2 thermoelectric junction enabled by substrate engineering. npj 2D Materials and Applications, 7, 36. (doi: 10.1038/s41699-023-00406-z)

Shields, T., Dada, A. C. , Hirsch, L., Yoon, S., Weaver, J. M. R., Faccio, D. , Caspani, L., Peccianti, M. and Clerici, M. (2022) Electro-optical sampling of single-cycle Thz fields with single-photon detectors. Sensors, 22(23), 9432. (doi: 10.3390/s22239432)

Umatova, Z., Zhang, Y., Rajkumar, R., Dobson, P. S. and Weaver, J.M.R. (2019) Quantification of atomic force microscopy tip and sample thermal contact. Review of Scientific Instruments, 90(9), 095003. (doi: 10.1063/1.5097862)

Ge, Y., Zhang, Y., Weaver, J. M.R. and Dobson, P. S. (2017) Dimension- and shape-dependent thermal transport in nano-patterned thin films investigated by scanning thermal microscopy. Nanotechnology, 28(48), 485706. (doi: 10.1088/1361-6528/aa93cf)

Ge, Y., Zhang, Y., Booth, J. A., Weaver, J. M.R. and Dobson, P. S. (2016) Quantification of probe-sample interactions of a scanning thermal microscope using a nanofabricated calibration sample having programmable size. Nanotechnology, 27(32), 325503. (doi: 10.1088/0957-4484/27/32/325503) (PMID:27363896)

Ge, Y., Zhang, Y., Weaver, J. M.R., Zhou, H. and Dobson, P. S. (2015) Topography-free sample for thermal spatial response measurement of scanning thermal microscopy. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 33, 06FA03. (doi: 10.1116/1.4933172)

Samarelli, A. et al. (2014) Prospects for SiGe thermoelectric generators. Solid-State Electronics, 98, 70 - 74. (doi: 10.1016/j.sse.2014.04.003)

Thoms, S. , Macintyre, D. S., Docherty, K. E. and Weaver, J. M.R. (2014) Alignment verification for electron beam lithography. Microelectronic Engineering, 123, pp. 9-12. (doi: 10.1016/j.mee.2014.02.005)

Samarelli, A. et al. (2014) Multilayered Ge/SiGe material in microfabricated thermoelectric modules. Journal of Electronic Materials, 43(10), pp. 3838-3843. (doi: 10.1007/s11664-014-3233-z)

Rossi, S., Alomari, M., Zhang, Y., Bychikhin, S., Pogany, D., Weaver, J.M.R. and Kohn, E. (2013) Thermal analysis of submicron nanocrystalline diamond films. Diamond and Related Materials, 40, pp. 69-74. (doi: 10.1016/j.diamond.2013.10.004)

Cecchi, S. et al. (2013) Ge/SiGe superlattices for thermoelectric devices grown by low-energy plasma-enhanced chemical vapor deposition. Journal of Electronic Materials, 42(7), pp. 2030-2034. (doi: 10.1007/s11664-013-2511-5)

Ferre Llin, L. et al. (2013) Thermal conductivity measurement methods for SiGe thermoelectric materials. Journal of Electronic Materials, 42(7), pp. 2376-2380. (doi: 10.1007/s11664-013-2505-3)

Samarelli, A. et al. (2013) Power factor characterization of Ge/SiGe thermoelectric superlattices at 300 K. Journal of Electronic Materials, 42(7), pp. 1449-1453. (doi: 10.1007/s11664-012-2287-z)

Samarelli, A. et al. (2013) The thermoelectric properties of Ge/SiGe modulation doped superlattices. Journal of Applied Physics, 113(23), Art. 233704. (doi: 10.1063/1.4811228)

Burt, D.P., Dobson, P.S. , Docherty, K.E., Jones, C.W., Leach, R.K., Thoms, S. , Weaver, J.M.R. and Zhang, Y. (2012) Aperiodic interferometer for six degrees of freedom position measurement. Optics Letters, 37(7), pp. 1247-1249. (doi: 10.1364/OL.37.001247)

Denholme, S.J., Dobson, P.S. , Weaver, J.M.R., MacLaren, I. and Gregory, D.H. (2012) Growth and characterisation of titanium sulphide nanostructures by surface-assisted vapour transport methods; from trisulphide ribbons to disulphide nanosheets. International Journal of Nanotechnology, 9(1-2), pp. 23-38. (doi: 10.1504/IJNT.2012.044828)

Liu, Z., Chen, X., Zhang, Y., Weaver, J. and Roberts, C.J. (2012) An optical leveling technique for parallel near-field photolithography system. Applied Physics Letters, 101(17), p. 173112. (doi: 10.1063/1.4764912)

Paul, D. et al. (2012) Si/SiGe thermoelectric generators. ECS Transactions, 50(9), pp. 959-963. (doi: 10.1149/05009.0959ecst)

ul-Haq, E., Liu, Z., Zhang, Y., Alang Ahmad, S.A., Wong, L.S., Hobbs, J., Leggett, G., Micklefield, J., Roberts, C. and Weaver, J. (2011) The Snomipede: a parallel platform for scanning near-field photolithography. Journal of Materials Research, 26(24), pp. 2997-3008. (doi: 10.1557/jmr.2011.370)

Basith, M., McVitie, S. , McGrouther, D. , Chapman, J.N. and Weaver, J. (2011) Direct comparison of domain wall behavior in permalloy nanowires patterned by electron beam lithography and focused ion beam milling. Journal of Applied Physics, 110(8), 083904. (doi: 10.1063/1.3642966)

Zhang, Y., Dobson, P. and Weaver, J. (2011) Batch fabricated dual cantilever resistive probe for scanning thermal microscopy. Microelectronic Engineering, 88(8), pp. 2435-2438. (doi: 10.1016/j.mee.2011.02.040)

Denholme, S.J., Gallagher, J.B., Dobson, P.S. , Weaver, J.M.R. and Gregory, D.H. (2010) New surface-directed vapour transport methods for the controlled growth of nickel sulfide nanomaterials. Israel Journal of Chemistry, 50(4), pp. 515-523. (doi: 10.1002/ijch.201000061)

Edgeworth, J.P., Burt, D.P., Dobson, P.S. , Weaver, J.M.R. and Macpherson, J.V. (2010) Growth and morphology control of carbon nanotubes at the apexes of pyramidal silicon tips. Nanotechnology, 21(10), (doi: 10.1088/0957-4484/21/10/105605)

ul Haq, E. et al. (2010) Parallel scanning near-field photolithography: the snomipede. Nano Letters, 10(11), pp. 4375-4380. (doi: 10.1021/nl1018782)

Zhang, Y., Docherty, K.E. and Weaver, J. (2010) Batch fabrication of cantilever array aperture probes for scanning near-field optical microscopy. Microelectronic Engineering, 87(5-8), pp. 1229-1232. (doi: 10.1016/j.mee.2009.11.140)

Burt, D.P., Whyte, W.M., Weaver, J.M.R., Glidle, A., Edgeworth, J.P., Macpherson, J.V. and Dobson, P.S. (2009) Effects of metal underlayer grain size on carbon nanotube growth. Journal of Physical Chemistry C, 113(34), pp. 15133-15139. (doi: 10.1021/jp902117g)

Docherty, K., Lister, K.A., Romijn, J. and Weaver, J.M.R. (2009) High robustness of correlation-based alignment with Penrose patterns to marker damage in electron beam lithography. Microelectronic Engineering, 86(4-6), pp. 532-534. (doi: 10.1016/j.mee.2008.11.037)

O'Shea, K.J., McVitie, S. , Chapman, J.N. and Weaver, J.M.R. (2008) Direct observation of changes to domain wall structures in magnetic nanowires of varying width. Applied Physics Letters, 93(20), p. 202505. (doi: 10.1063/1.3023048)

Kong, X., McVitie, S., Chapman, J.N., Weaver, J.M.R., O'Donnell, D.O. and Johnston, A.B. (2008) Magnetization processes in single-layer and laminated CoFe films patterned into multiscale elements with write-head-like geometries. Journal of Applied Physics, 104, 013925. (doi: 10.1063/1.2952068)

Kong, X., Krasa, D., Zhou, H. P., Williams, W., McVitie, S. , Weaver, J. M. R. and Wilkinson, C. D. W. (2008) Very high resolution etching of magnetic nanostructures in organic gases. Microelectronic Engineering, 85(5-6), pp. 988-991. (doi: 10.1016/j.mee.2007.12.006)

Burt, D. P., Dobson, P. S. , Donaldson, L. and Weaver, J. M. R. (2008) A simple method for high yield fabrication of sharp silicon tips. Microelectronic Engineering, 85(3), pp. 625-630. (doi: 10.1016/j.mee.2007.11.010)

Docherty, K.E., Thoms, S. , Dobson, P. and Weaver, J.M.R. (2008) Improvements to the alignment process in a commercial vector scan electron beam lithography tool. Microelectronic Engineering, 85(5-6), pp. 761-763. (doi: 10.1016/j.mee.2008.01.081)

Aubry, R., Jacquet, J., Weaver, J., Durand, O., Dobson, P., Mills, G., di Forte-Poisson, M., Cassette, S. and Delage, S. (2007) SThM temperature mapping and nonlinear thermal resistance evolution with bias on AlGaN/GaN HEMT devices. IEEE Transactions on Electron Devices, 54, pp. 385-390. (doi: 10.1109/TED.2006.890380)

Dobson, P., Weaver, J., Burt, D., Holder, M., Wilson, N., Unwin, P. and Macpherson, J. (2006) Electron beam lithographically-defined scanning electrochemical-atomic force microscopy probes: fabrication method and application to high resolution imaging on heterogeneously active surfaces. Physical Chemistry Chemical Physics, 8, pp. 3909-3914. (doi: 10.1039/b605828k)

Macintyre, D.S., Young, I., Glidle, A., Cao, X., Weaver, J.M.R. and Thoms, S. (2006) High resolution e-beam lithography using a thin titanium layer to promote resist adhesion. Microelectronic Engineering, 83(4-9), pp. 1128-1131. (doi: 10.1016/j.mee.2006.01.103)

Burt, D., Wilson, N., Weaver, J., Dobson, P. and Macpherson, J. (2005) Nanowire probes for high resolution combined scanning electrochemical Microscopy - Atomic force Microscopy. Nano Letters, 5, pp. 639-643. (doi: 10.1021/nl050018d)

Dobson, P., Mills, G. and Weaver, J. (2005) Microfabricated temperature standard based on Johnson noise measurement for the calibration of micro- and nano-thermometers. Review of Scientific Instruments, 76, (doi: 10.1063/1.1899463)

Dobson, P., Weaver, J., Holder, M., Unwin, P. and Macpherson, J. (2005) Characterization of batch-microfabricated scanning electrochemical-atomic force microscopy probes. Analytical Chemistry, 77, pp. 424-434. (doi: 10.1021/ac048930e)

Steinmann, P. and Weaver, J. (2005) Nanometer-scale gaps between metallic electrodes fabricated using a statistical alignment technique. Applied Physics Letters, 86, (doi: 10.1063/1.1862342)

Lister, K.A., Thoms, S. , Macintyre, D.S., Wilkinson, C.D.W., Weaver, J.M.R. and Casey, B.G. (2004) Direct imprint of sub-10 nm features into metal using diamond and SiC stamps. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 22(6), pp. 3257-3259. (doi: 10.1116/1.1825010)

Lister, K., Casey, B., Dobson, P., Thoms, S., Macintyre, D., Wilkinson, C. and Weaver, J. (2004) Pattern transfer of a 23 nm-period grating and sub-15 nm dots into CVD diamond. Microelectronic Engineering, 73-4, pp. 319-322. (doi: 10.1016/j.mee.2004.02.060)

Steinmann, P. and Weaver, J.M.R. (2004) Fabrication of sub-5 nm gaps between metallic electrodes using conventional lithographic techniques. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 22(6), pp. 3178-3181. (doi: 10.1116/1.1808712)

Steinmann, P., Lister, K.A. and Weaver, J.M.R. (2003) Fabrication of metallic tunnel junctions for the scanning single electron transistor atomic force microscope. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 21(5), pp. 2138-2141. (doi: 10.1116/1.1612931)

Johannessen, E., Weaver, J., Bourova, L., Svoboda, P., Cobbold, P. and Cooper, J. (2002) Micromachined nanocalorimetric sensor for ultra-low-volume cell-based assays. Analytical Chemistry, 74, pp. 2190-2197. (doi: 10.1021/ac011028b)

Johannessen, E., Weaver, J., Cobbold, P. and Cooper, J. (2002) Heat conduction nanocalorimeter for pl-scale single cell measurements. Applied Physics Letters, 80, pp. 2029-2031. (doi: 10.1063/1.1457532)

Chong, B.K., Zhou, H., Mills, G., Donaldson, L. and Weaver, J.M.R. (2001) Scanning Hall probe microscopy on an atomic force microscope tip. Journal of Vacuum Science and Technology A: Vacuum, Surfaces, and Films, 19(4), pp. 1769-1772.

Zhou, H., Chong, B.K., Stopford, P., Mills, G., Midha, A., Donaldson, L. and Weaver, J. (2000) Lithographically defined nano and micro sensors using "float coating" of resist and electron beam lithography. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 18(6), pp. 3594-3599. (doi: 10.1116/1.1321271)

Zhou, H., Midha, A., Mills, G., Donaldson, L. and Weaver, J.M.R. (1999) Scanning near-field optical spectroscopy and imaging using nanofabricated probes. Applied Physics Letters, 75(13), pp. 1824-1826. (doi: 10.1063/1.124840)

Zhou, H., Midha, A., Bruchhaus, L., Mills, G., Donaldson, L. and Weaver, J.M.R. (1999) Novel scanning near-field optical microscopy/atomic force microscope probes by combined micromachining and electron-beam nanolithography. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 17(5), p. 1954. (doi: 10.1116/1.590855)

Zhou, H., Mills, G., Chong, B.K., Midha, A., Donaldson, L. and Weaver, J.M.R. (1999) Recent progress in the functionalization of atomic force microscope probes using electron-beam nanolithography. Journal of Vacuum Science and Technology A: Vacuum, Surfaces, and Films, 17(4), pp. 2233-2239. (doi: 10.1116/1.581753)

Mills, G., Zhou, H., Midha, A., Donaldson, L. and Weaver, J.M.R. (1998) Scanning thermal microscopy using batch fabricated thermocouple probes. Applied Physics Letters, 72(22), pp. 2900-2902. (doi: 10.1063/1.121453)

Zhou, H., Midha, A., Mills, G., Thoms, S. , Murad, S.K. and Weaver, J.M.R. (1998) Generic scanned-probe microscope sensors by combined micromachining and electron-beam lithography. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 16(1), pp. 54-58. (doi: 10.1116/1.589835)

Conference Proceedings

Paul, D.J. et al. (2013) Prospects for SiGe thermoelectric generators. In: 14th International Conference on Ultimate Integration on Silicon (ULIS) 2013, Warwick, U.K., 19-21 Mar 2013, pp. 5-8. (doi: 10.1109/ULIS.2013.6523478)

Paul, D. et al. (2012) Si/SiGe nanoscale engineered thermoelectric materials for energy harvesting. In: 12th IEEE Conference on Nanotechnology, Birmingham, UK, 20-23 Aug 2012, (doi: 10.1109/NANO.2012.6322044)

Zhang, Y., Dobson, P.S. , Weaver, J.M.R., Rossi, S., Alomari, M., Kohn, E., Bychikhin, S. and Pogany, D. (2012) Measuring thermal conductivity of nanocrystalline diamond film with a scanning thermal microscope. In: 12th IEEE Conference on Nanotechnology, Birmingham, UK, 20-23 Aug 2012,

Burt, D.P., Dobson, P.S. , Weaver, J.M.R., Wilson, N.R., Unwin, P.R. and Macpherson, J.V. (2007) Developments in nanowire scanning electrochemical - atomic force microscopy (SECM-AFM) probes. In: IEEE Sensors Conference, Atlanta, GA, 28-31 Oct 2007, pp. 712-715. (doi: 10.1109/ICSENS.2007.4388499)

Patents

The University Court of the University of Glasgow; Weaver, Jonathan M.R.; Dobson, Phillip S.; Burt, David P.; Thoms, Stephen; Docherty, Kevin E.; Zhang, Yuan (2010) Uses of Electromagnetic Interference Patterns. .