Inductively Coupled Plasma Optical Emission Spectroscopy
Agilent 5900 ICP-OES
Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES) allows the user to quantitatively determine the concentration of known elements within a solution, by comparison to standard solutions of known concentration for each desired element. In addition, a semi-quantitative screening procedure can provide a breakdown of all detectable elements within a sample, their relative abundancies, and can inform the method used for the full quantitative analysis.
ICP-OES has broad applications, including inorganic materials such as catalysts and MOFs, leaching tests for reaction mixtures, mineral content of soils, waters and sediments and many others.
The following 70 elements can be detected using the ICP-OES:
Al, As, Ag, Au, Ba, Be, Bi, B, Cd, Ca, Ce, Cs, Cr, Co, Cu, Dy, Eu, Fe, Gd, Ga, Ge, Hf, Hg, Ho, In, Ir, K, La, Li, Lu, Mg, Mn, Mo, Na, Nd, Ni, Nb, Os, Pd, P, Pt, Pr, Pb, Re, Rh, Rb, Ru, Sb, Sm, Sn, Sc, Se, Si, Sr, S, Ta, Te, Tb, Tl, Th, Tm, Ti, W, U , V, Yb, Y, Zn, Zr
Agilent 5900 features:
- Quantitative analysis of all 70 elements with detection limits down to a few ppb
- Multiple elements can be quantified simultaneously
- High-throughput valve system allows samples to be analysed in less than a minute, so dozens can be measured in a single run
- Semi-quantitative screening tests can identify elemental composition of unknown samples without the need for sample-specific calibrations
- Newly installed microwave digestion system provides an option for sample preparation procedures
Please note that owing to the design of the instrument, organic solvents and samples containing hydrofluoric acid (HF) cannot be analysed with the ICP-OES. DI water or an inorganic solvent such as dilute nitric acid are the most appropriate options.