This course follows on from the NASI1 (PHYS5041) course to explore more advanced aspects of the Physics and applications of nanometre and atomic scale imaging techniques that are used to investigate materials in various classes and across the boundaries of traditional research disciplines.

A major focus is given to TEM (transmission electron microscopy) topics including: electron optics and other aspects of TEM instrumentation, aberration correction, Lorentz imaging of ferro-magnetic/electric materials, diffraction and nanoanalysis.

Due to the advanced nature of this course, successful completion of the NASI1 course is ideal. Exceptions might be made for students who have done equivalent content at another university on a case-by-case basis. It is envisaged that this course will be highly attractive to students who have a very strong interest in materials research and are possibly following the Advanced Functional Materials MSc track.

Two lectures a week for first half of semester

Lab sessions 14:00-17:00 once a week in weeks 24-26 and 28-30

None

None

1) Continuous assessment via two laboratory record submissions about the results of their laboratory analysis

2) A mid-course presentation in a seminar to course lecturers and other students giving a short summary of recent developments in one area covered by the course

3) End of course submission of a short report with their reflections on some recent published developments in one area covered by the course

Students achieving a grade below C3 can be allowed the opportunity to retake oral and report elements of assessment for the course.

Laboratory experiments cannot be repeated due to a lack of time and facilities.

To provide students with an opportunity to develop knowledge and understanding at an advanced level of the physical principles underpinning the imaging of materials at the nanometre and atomic length scales.

By the end of this course students will be able to:

1) describe the Physics underpinning electron guns, lenses, lens aberrations, deflectors, vacuum systems and the principles involved in the design of cutting edge (S)TEM ((scanning) transmission electron microscope) instruments

2) explain why spherical aberration (Cs) is inherent to all round lenses, how correction of Cs (and other aberrations) is achieved and describe the improvements in TEM/STEM performance that result

3) explain advanced aspects of image contrast formation including diffraction, phase and incoherent contrast and Lorentz techniques for imaging of magnetic and electric polarisation/fields

4) explain the origin of the principal features seen in diffraction patterns, including discrete spots, Kikuchi bands, Higher Order Laue Zones, and diffuse scattering; as well as their use in materials characterisation, TEM image formation, and 4DSTEM (4-dimensional STEM)/scanned diffraction techniques

5) explain the detailed operation of both EDS (Energy Dispersive [X-ray] Spectroscopy) and EELS (Electron Energy Loss Spectroscopy) spectrometers and describe how processing of X-ray and EELS data can be performed to enable analysis of composition, chemical bonding and other material properties

6) apply this knowledge to characterisation of real samples in a laboratory incorporating microscope usage and post-experiment computational data analysis

7) be able to summarise some of the recent developments in these fields in oral presentations and written reports

No additional requirements