This course will explain the operation of common detector technologies, particularly semiconductors, and their application to various imaging problems based on specific performance parameters. The course will provide students with an appreciation of the performance of detectors in applications that are of interest across the broad science base, and is intended to appeal to Schools throughout the College.

Typically 2 lectures per week

None

None

Assessment

Unseen examination.

Reassessment

In accordance with the University's Code of Assessment reassessments are normally set for all courses which do not contribute to the honours classifications. For non honours courses, students are offered reassessment in all or any of the components of assessment if the satisfactory (threshold) grade for the overall course is not achieved at the first attempt. This is normally grade D3 for undergraduate students, and grade C3 for postgraduate students. Exceptionally it may not be possible to offer reassessment of some coursework items, in which case the mark achieved at the first attempt will be counted towards the final course grade. Any such exceptions are listed below in this box.

The aims of this course are:

1. To describe the principles of imaging statistics and imaging methods and systems

2. To describe a range of practical detector applications, in material characterisation, medicine and security.

3. to explore the principles of operation and the performance of different common types of detector, particularly silicon-based systems.

By the end of this course students will be able to:

1. explain the principles of imaging techniques and methods of evaluating system performance, for a variety of imaging applications.

2. explain the principles of operation and performance of different types of detector, particularly silicon-based systems, for a variety of sensor structures

Students must submit at least 75% by weight of the components (including examinations) of the course's summative assessment.