Writing in Science Magazine, Baoqing Sun of the Optics Group with collaborators in Statistics has used the projection of random patterns to measure the 3D profile of an object. For each pattern, the backscattered light is measured with a single pixel detector, and the signals from a known sequence of random patterns allows an image of the object to be inferred. The shadow of information from obtained from three extra detectors enables the full 3D profile to be obtained.


http://www.sciencemag.org/content/340/6134/844.full

First published: 23 May 2013

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